To improve the fault coverage, storage-mode is added to LFSR-mode.
用随机测试模式加存储测试模式，来提高故障覆盖率。
The results of experiments suggest a higher fault coverage is achieved.
实验结果表明，故障覆盖率取得了满意的结果。
Advanced software will help you predict the fault coverage for the test at hand.
高级的软件能帮助你预测手边的测试的故障覆盖率。
As an important white-box test method, the basic path test has higher fault coverage.
基本路径测试是一种重要的白盒测试技术，具有较高的故障覆盖率。
DFT circuits implemented in RPR ASIC reduces difficulties in circuit test and greatly improves fault coverage.
DFT电路的实现大大降低了专用集成电路的测试难度，提高了故障覆盖率。
The first model supposes every test case has equal fault detective ability and can get the same fault coverage.
第一个模型假设每个测试用例有相同的故障检测能力，能获得相同的故障覆盖率；
The author uses the C program to finish the parallel fault simulation that is used to calculate the fault coverage.
在电路测试时利用这个程序来计算故障覆盖率。
For testing chip pins, the fault coverage can reach 100%, and the fault position can be positioned with high accuracy.
对芯片管脚的测试可以提供100%的故障覆盖率，且能实现高精度的故障定位。
The configuration structure of test, the fault coverage, the implementation problems and their solutions were discussed.
文章给出了应用这种方法进行测试的配置结构、故障覆盖率和测试中出现的问题及其解决办法。
Tests results showed that this method could test MCM effectively at a shorter time with a fault coverage of more than 95%.
建立模型进行验证的结果表明：该方法能有效地测试MCM，缩短了测试时间，故障覆盖率达到95%以上。
Reseeding is a built-in self-test (B. IST) testing method, which is used to improve fault coverage of pseudo-random testing.
重新播种的测试方法是一种内建自测试方法，它可以用来提高伪随机测试矢量的故障覆盖率。
The proposed method can generate simplified test patterns with high fault coverage, and can detect multiple faults as many as possible.
新方法可生成精简的、故障覆盖率高的测试图形，并尽可能多地检测多重故障。
The experiments indicate that functional test sets may be able to identify functions whose realizations have low path delay fault coverage.
实验表明，这种功能测试集具有实现低路径延迟故障覆盖范围的功能。
And, when coupled with functional testing, the fault coverage for the entire process is as good as or better than in-circuit testing alone.
加上功能测试，这个过程中检测到的故障率要比单独进行在线测试故障发现率大。
Experimental results show that the proposed testing algorithms have merits such as high fault coverage, strong diagnostic ability and less testing time.
实验结果表明，此测试算法具有故障覆盖率高，诊断故障能力强，测试需要的时间少等优点。
The result indicates that the technology manipulates easily and is effective, the fault coverage reaches 90%, it is a feasible test generation technology.
仿真结果表明，该方法操作简单、有效，故障覆盖率达到了90%，是一种很可行的存储器板测试生成方法。
Finally, the loss of fault coverage due to the introduction of the parity tree is analyzed, and the detection of faults in the parity trees are described.
最后，分析了由于奇偶树的引入带来的故障覆盖率的损失及奇偶树中故障的检测。
The experiments show that the proposed method can reduce peak power, average power and energy simultaneously at the cost of a little fault coverage dropping.
实验表明，在稍微降低故障覆盖率的条件下，本文提出的测试方法能显著降低测试的峰值功耗，同时也能降低平均功耗和能耗。
Experimental results show that the proposed strategy is effective in software testing for conquering test blindness, reducing test cost and improving fault coverage.
实验结果表明：该方法是一种有效的边界测试点选取策略，可以克服测试的盲目性，降低测试成本，明显地提高故障覆盖程度。
With ensuring the fault coverage, the adaptive scan can be ten-fold reduction in the number of test vectors, thus reducing test time and ultimately reduce the cost of chip.
自适应的扫描压缩方法在保证故障覆盖率的前提下，能够数十倍的减少测试矢量，进而减少测试所需时间，最终降低芯片成本。
Besides, there is neither fault coverage degradation nor extra control signal. So far as we know, this is the first work to demonstrate the capture power reduction on silicon.
除此之外，既不减少错误覆盖率也不增加控制讯号，因此如我们所知，这是第一个以矽制程展示峰值功率降低的研究。
This paper presents an approach to delay testing with duplicating variable observation points, which provides a high path delay fault coverage by testing a small number of paths.
本文提供了一种使用双倍可变观测点进行时滞测试的方法，保证了只需要测试少量通路就能完成整个电路的时滞测试。
In order to reduce the loss of the fault coverage when using the parity tree to compact the test response, a method of grouping compaction of the output pins is proposed in the paper.
为了减少利用奇偶树压缩测试响应时的故障覆盖损失，提出了一种输出端分组压缩的方法。
This paper describes the fault models and test principles of the BS test access port (TAP) lines on PCBs. A test algorithm with high fault coverage and short time is then presented fort…
本文论述了板级边界扫描测试存取口的故障模型和测试原理，并针对全边界扫描印制板提出了一种故障覆盖率高、测试时间短的测试算法。
To assure the precision of evaluations and predictions, a good software reliability model should have the function of describing test coverage and can reflect the fault repair process.
为了保证可靠性模型的估测精度，好的软件可靠性模型应该包括对测试覆盖的说明，并且能够反映软件的错误修复过程。
In this paper, we firstly review the Non homogeneous Poisson Process (NHPP) model based on test coverage, and then discuss a Non homogeneous Markov model with fault repair.
本文在基于测试覆盖的NHPP模型的基础上，讨论一种能反映软件错误修复过程的非齐次马尔可夫模型。
We step by step find approaches for system reliability from simple to complex upon introducing fault tree analysis, phased mission systems and imperfect coverage, respectively.
本文在分别评述故障树分析方法、多阶段任务系统和不完全覆盖的基础上，由简单到复杂，逐步深入研究相关的系统可靠性分析方法。
The markov model is applied to analyze the influence of fault detection coverage and diagnosis success rate for system availability.
通过建立马尔科夫模型，分析了双机系统的可用性，研究了故障检测覆盖率和故障诊断成功率对系统可用性的影响。
Coverage is an important concept in fault tolerant systems design and evaluation.
覆盖率是容错系统设计和评估中的重要概念。
Coverage is an important concept in fault tolerant systems design and evaluation.
覆盖率是容错系统设计和评估中的重要概念。
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