To improve the fault coverage, storage-mode is added to LFSR-mode.
用随机测试模式加存储测试模式，来提高故障覆盖率。
DFT circuits implemented in RPR ASIC reduces difficulties in circuit test and greatly improves fault coverage.
DFT电路的实现大大降低了专用集成电路的测试难度，提高了故障覆盖率。
The first model supposes every test case has equal fault detective ability and can get the same fault coverage.
第一个模型假设每个测试用例有相同的故障检测能力，能获得相同的故障覆盖率；
The author uses the C program to finish the parallel fault simulation that is used to calculate the fault coverage.
在电路测试时利用这个程序来计算故障覆盖率。
For testing chip pins, the fault coverage can reach 100%, and the fault position can be positioned with high accuracy.
对芯片管脚的测试可以提供100%的故障覆盖率，且能实现高精度的故障定位。
The configuration structure of test, the fault coverage, the implementation problems and their solutions were discussed.
文章给出了应用这种方法进行测试的配置结构、故障覆盖率和测试中出现的问题及其解决办法。
Tests results showed that this method could test MCM effectively at a shorter time with a fault coverage of more than 95%.
建立模型进行验证的结果表明：该方法能有效地测试MCM，缩短了测试时间，故障覆盖率达到95%以上。
Reseeding is a built-in self-test (B. IST) testing method, which is used to improve fault coverage of pseudo-random testing.
重新播种的测试方法是一种内建自测试方法，它可以用来提高伪随机测试矢量的故障覆盖率。
The proposed method can generate simplified test patterns with high fault coverage, and can detect multiple faults as many as possible.
新方法可生成精简的、故障覆盖率高的测试图形，并尽可能多地检测多重故障。
Experimental results show that the proposed testing algorithms have merits such as high fault coverage, strong diagnostic ability and less testing time.
实验结果表明，此测试算法具有故障覆盖率高，诊断故障能力强，测试需要的时间少等优点。
The result indicates that the technology manipulates easily and is effective, the fault coverage reaches 90%, it is a feasible test generation technology.
仿真结果表明，该方法操作简单、有效，故障覆盖率达到了90%，是一种很可行的存储器板测试生成方法。
The experiments show that the proposed method can reduce peak power, average power and energy simultaneously at the cost of a little fault coverage dropping.
实验表明，在稍微降低故障覆盖率的条件下，本文提出的测试方法能显著降低测试的峰值功耗，同时也能降低平均功耗和能耗。
Experimental results show that the proposed strategy is effective in software testing for conquering test blindness, reducing test cost and improving fault coverage.
实验结果表明：该方法是一种有效的边界测试点选取策略，可以克服测试的盲目性，降低测试成本，明显地提高故障覆盖程度。
This paper presents an approach to delay testing with duplicating variable observation points, which provides a high path delay fault coverage by testing a small number of paths.
本文提供了一种使用双倍可变观测点进行时滞测试的方法，保证了只需要测试少量通路就能完成整个电路的时滞测试。
In order to reduce the loss of the fault coverage when using the parity tree to compact the test response, a method of grouping compaction of the output pins is proposed in the paper.
为了减少利用奇偶树压缩测试响应时的故障覆盖损失，提出了一种输出端分组压缩的方法。
This paper describes the fault models and test principles of the BS test access port (TAP) lines on PCBs. A test algorithm with high fault coverage and short time is then presented fort…
本文论述了板级边界扫描测试存取口的故障模型和测试原理，并针对全边界扫描印制板提出了一种故障覆盖率高、测试时间短的测试算法。
This paper describes the fault models and test principles of the BS test access port (TAP) lines on PCBs. A test algorithm with high fault coverage and short time is then presented fort…
本文论述了板级边界扫描测试存取口的故障模型和测试原理，并针对全边界扫描印制板提出了一种故障覆盖率高、测试时间短的测试算法。
应用推荐