The measuring condition for principle Angle in spectroscopic ellipsometry is analyzed.
对椭圆偏振光谱中的主角测量条件进行了分析。
Paints quality, Plastics, Polymer, Optical Brighteners and Phosphor Coatings ( Ellipsometry )
油漆质量，塑料，聚合物，荧光增白剂和磷涂层（椭圆偏振仪）
Accurate measurement of its retardation by ellipsometry prove the rationality of its structure design.
椭偏术对其相延测量的实验结果，验证了这种波片结构设计的合理性。
A simple method using spectroscopic ellipsometry to measure uniaxial liquid crystal layer is introduced.
探讨了利用普通光谱型椭偏仪对各向异性液晶层进行综合性测量的可行性。
The structure of the laser crystallized poly-Si thin film is analyzed by using spectroscopic ellipsometry.
采用椭偏光谱法分析了薄膜的结构，并提出多层膜模型模拟薄膜结构。
Imaging technique, interferometric method and ellipsometry are used in the defect detection of the thin film.
在薄膜缺陷检测领域，成像技术，干涉测量，椭偏测量等一系列测量手段都得到了应用。
Azimuth, in Ellipsometry - the Angle measured between the plane of incidence and the major axis of the ellipse.
椭圆方位角-测量入射面和主晶轴之间的角度。
The basic principle of ellipsometry, the technical problem applied it to the corrosion study have been introduced.
本文着重介绍了椭偏术的基本原理及其在腐蚀研究领域中应用的技术问题及解决方法。
Experiment result from imaging ellipsometry system demonstrates its availability and its precision reaches micron order.
该方法在椭偏成像系统的应用结果验证了其有效性，调焦精度达到微米量级。
A protein microarray biosensor based on imaging ellipsometry has been developed as a high-throughput and fast technique for protein analysis.
椭偏光学生物传感器是识别和检测蛋白质的一种新型的高通量、快速生物分子分析技术。
In this paper, we propose a method which make it possible to investigate the films with complex refraction index using spectroscopic ellipsometry.
本文提出一个利用椭偏光谱测量复数折射率薄膜的方法。
The feasibility of using protein A to immobilize antibody on the silicon surface of the imaging ellipsometry biosensor was investigated in this study.
研究了在硅片表面上通过A蛋白定向固定抗体分子用于椭偏光学生物传感器免疫检测的可能性。
The experimental results show that the ellipsometry with a new parameter VOP could be analyzed qualitatively for the electrochemical systems effectively.
用新物理量Vop的椭圆法定性地分析电化学体系已十分有效。
Feasibility of measuring complex refractive index with ellipsometry is discussed and a set of experiment equipment is set up to make elementary experiment.
探讨了椭圆偏振测量术应用生物组织复折射率测量的可行性，建立了相应的实验装置并进行了初步的实验测量。
After mathematical treatments of ellipsometry basic equations, unknown parameters can be obtained directly from measured data by means of the microcomputer.
对椭偏术基本方程进行数学处理，应用微型计算机可由测量值直接求得未知参数。
Through the establishment of different physical and dispersion models, the effects of the surface and interface on spectroscopic ellipsometry were inspected.
通过建立不同的物理和色散模型，分别考察了薄膜表面和界面的椭偏效应。
Based on the optical heterodyne interferometer and transmission ellipsometry, a new fast measurement technique of nanometer film was presented computational.
结合激光外差干涉法和透射式椭偏测量原理，研究了一种快速、高精度测量纳米厚度薄膜光学参数的方法。
When calculate the ellipsometry parameters of the transparent film on the transparent substrate, there may be a local minimum error, and analyse the cause of error.
迭代法在计算透明衬底透明膜的参数时，可能会出现局部极小的错误，分析了产生该错误的原因。
According to comparing with simulation annealing algorithm the paper introduce very fast simulation annealing algorithm and use VFSA to compute the ellipsometry data.
对比模拟退火算法介绍了非常快速模拟退火算法的流程，并使用非常模拟退火算法计算了椭偏数据。
Using spectroscopic ellipsometry, the influence of thermal annealing on optical properties of the plasma-deposited hydrogenated amorphous carbon films is investigated.
用椭圆偏振光谱法研究了热处理对射频辉光放电淀积的氢化非晶碳膜光学性质的影响。
Methods for determination oil volume on tin plate surface were reviewed, which include gravimetry, hydrophil balance method, molecular spectrometry and ellipsometry etc.
对测定镀锡板表面涂油量的测定方法进行了综述，这些方法包括重量法、亲水天平法、分子光谱法和椭圆偏振法等。
Optical heterodyne interferometry together with reflective ellipsometry, a fast measurement technology with high anti-interference performance was applied to nanometer film.
结合激光外差干涉术和反射式椭偏测量技术，设计了一种抗干扰能力强，快速、高精度测量纳米厚度薄膜光学参数的方法。
Fundamentals of ellipsometry and automatic ellipsometers are introduced briefly, and a sample machine of new type automatic null ellipsometer has been designed and constructed.
简要介绍了椭圆偏振测量术的基本原理及自动椭偏仪，并设计制作了一台新型自动消光椭偏仪的原理样机。
Ellipsometry, A. C. impedance and potential measurements have been used to study the dissolution behaviour and corrosion resistance of titanium anodic oxide film in 0.5n sulfuric acid.
本文用椭园法、交流阻抗及电位测量研究了钛阳极氧化膜在0.5N硫酸中的溶解规律和耐蚀性。
Ellipsometry is an optical analytical technique used to determine the optical constants and the film thickness from measurements of the change in polarization state of reflecting light.
椭圆偏振测量是一种通过分析偏振光在待测薄膜样品表面反射前后的偏振态的改变来获得薄膜材料的光学常数和薄膜厚度的高精度、非接触测量方法。
Variable Angle spectroscopic ellipsometry (VASE) is a instrument for measuring optical film refractive index and thickness and is a powerful technique for research on new materials and processes.
可变角度的光谱椭偏仪(VASE)是一种测量光学薄膜折射率和厚度的仪器，它对于新材料和新过程的研究是一种强有力的技术手段。
The characterization of SiN thin films was studied by spectral ellipsometry, reflection spectra, infrared absorption spectroscopy (IR) and quasi-steady state photoconductance (QSSPC) measurements.
利用椭圆偏振光谱、反射谱、红外吸收谱和准稳态光电导（QSSPC）分析了氮化硅薄膜的特性。
The characterization of SiN thin films was studied by spectral ellipsometry, reflection spectra, infrared absorption spectroscopy (IR) and quasi-steady state photoconductance (QSSPC) measurements.
利用椭圆偏振光谱、反射谱、红外吸收谱和准稳态光电导（QSSPC）分析了氮化硅薄膜的特性。
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