专业释义英英释义
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椭偏测量术 - 引用次数：6
The DOAP can be used as a polarization state detector in real-time polarimetry, ellipsometry and Mueller matrix ellipsometry.
分振幅偏振光计可用作实时偏振测量术、椭偏测量术和米勒矩阵椭偏测量术中的偏振态探测器。
参考来源 - 基于振幅分割的光偏振测量技术的研究椭偏测量法 - 引用次数：2 参考来源 - 提高椭偏测量中薄膜参数精度的研究椭圆测量术 -
椭圆偏振 - 引用次数：4
From the measured result of spectroscopic ellipsometry, we know that the refractive index (n) and the extinction coefficient (k) are reduced with the rise of the substrate temperature and the increase of wavelength.
通过对样品的椭圆偏振光谱测试分析可知，随着衬底温度的升高，样品的折射率和消光系数均随波长增长呈递减趋势，且在波长为500nm后递减的幅度变小。
参考来源 - 脉冲激光沉积法制备ZnO薄膜及其光学性质的研究 -
椭圆光度法椭圆对称
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椭圆对称
·2,447,543篇论文数据，部分数据来源于NoteExpress
Ellipsometry
- abstract: Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties.
以上来源于: WordNet
双语例句
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The measuring condition for principle Angle in spectroscopic ellipsometry is analyzed.
对椭圆偏振光谱中的主角测量条件进行了分析。
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Accurate measurement of its retardation by ellipsometry prove the rationality of its structure design.
椭偏术对其相延测量的实验结果，验证了这种波片结构设计的合理性。
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The structure of the laser crystallized poly-Si thin film is analyzed by using spectroscopic ellipsometry.
采用椭偏光谱法分析了薄膜的结构，并提出多层膜模型模拟薄膜结构。
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