• Base on this expression, the spectra in the diffraction field were investigated theoretically.

    根据该表达式对衍射场中的光谱进行了理论研究。

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  • By solving these equations, the diffraction trace of a curved surface and the position of the edge's diffraction point are determined so that the diffraction field can be obtained.

    求解寻迹方程,便得到曲面绕射线的轨迹和边缘绕射点的位置,从而可以计算它的绕射场。

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  • Another important application of diffraction theory is the study of the far field divergence Angle of a collimated light beam.

    衍射理论的另一个重要应用就是研究准直光束的远场发散角。

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  • The far field diffractive pattern calculating formula for diffraction antenna with continuous phase structure is derived by current distribution method in antenna theory for the first time.

    应用天线理论中的电流分布法,首次推导了具有连续位相结构的反射式毫米波衍射天线的远场衍射图计算公式。

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  • The results obviously demonstrate wave diffraction in harbor on condition of boundary reflection. Distribution of wave field in harbor is relatively appropriate.

    结果比较清楚地反映出在考虑边界反射条件下波浪绕射情况,港内波浪场的分布比较合理。

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  • Based on the uniform geometrical theory of diffraction, the equivalent current is used to calculate the back scattering field for the finite cone.

    在一致性几何绕射理论基础上,采用等效电流的方法给出了有限锥体在完全极化平面波照射下后向散射场的散射极化矩阵表示式。

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  • For microwave diffraction imaging, we use the WKB approximation to estimate the total field in the dielectric object.

    对于介质目标微波衍射成象,本文引入了WKB近似来模拟目标内部总场。

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  • So liquid crystal grating is used in extensive field such as diffraction optics, photoelectric switch, deflexion controlling of light beam.

    因此液晶光栅的这种光电特性在衍射光学、光电开关、光束偏转控制等许多领域具有广泛的应用前景。

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  • They have been characterized respectively by transition electronic microscope (TEM), X-ray powder diffraction (XRD), field induced surface photovoltage spectrum (FISPS).

    对其进行了透射电镜(tem)、X射线粉末衍射(XRD),场诱导表面光电压谱表征(FISPS)。

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  • This research shows that the RSNOM could detect the evanescent near field wave effectively, and the image with a super diffraction limit resolution was obtained.

    成像研究表明该装置可对近场衰逝分量进行有效探测并实现了超衍射极限成像。

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  • Finally, the computation of wave reflection and diffraction in the Dalian Harbor indicates that the present method can be widely used for computing the wave field in harbors.

    对大连港区内的波浪折射绕射进行了计算,表明本方法可以应用于实际港口的波浪场计算中。

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  • On applying the diffraction theory and with the aid of the reciprocity theorem, an approximate formula for the radiation field of a slot cut in a metal sheet of finite size is derived.

    本文应用绕射理论并借助于互易定理,导出了一个在有限尺寸金属平板上割出的一条裂缝的近似辐射埸公式。

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  • The phase composition and microstructure of mullite powders were investigated by X-ray diffraction and field emission scanning election microscopy techniques.

    利用X射线衍射仪和场致发射扫描电子显微镜等手段对合成粉体的相组成、结构和形貌进行了研究。

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  • With light wave diffraction theory, the mathematical model of optical field at the recording layer is developed for magneto-optical disk.

    运用光波衍射理论,针对磁光盘建立了记录光场的数学模型。

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  • Role of the cavity field, the electrostatic repulsive force at the domain boundary and self-enhanced diffraction light induced by physical imperfection on laser-induced surface damage are discussed.

    本文讨论了由晶体缺陷所致的自增强衍射光,富集于缺陷的空间电荷所致的空洞场,以及由此场导致的发生在畴界上的静电斥力对此损伤所起的作用。

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  • The two dimentional problems of the diffraction of the electromagnetic wave by a perfect arbitrary form conductor inbedded in the electromagnetic field are discussed in detail.

    本文详细地讨论了置于电磁场中的任意形状的完全导体对电磁波绕射的二维问题;

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  • Influence of CO2 partial pressure on corrosion scale of P110 steel in stimulated oil field environments was investigated by using scanning electron microscopy(SEM) and x-ray diffraction(XRD).

    利用高温高压釜设备辅以失重法、采用扫描电子显微镜(SEM)和X射线衍射(XRD)技术,研究了在动静两种状态下CO2分压对P110钢腐蚀产物膜的影响。

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  • This in turn leads up to asking the question of exactly how large is the diffraction limited field of view.

    反过来,又引出一个新的问题,衍射极限的视角到底有多大?

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  • This near field analytical method can be adopted to other diffraction optics.

    该色分离光栅近场分析和计算模拟方法也可用于其他衍射光学元件。

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  • It utilizes the evanescent field confined at the tiny aperture for providing images of object surfaces with a resolution beyond the classical optical diffraction limit.

    这种显微镜利用局限在微小孔径上的隐失场提供物体表面形貌的细节,其分辨率可突破传统光学的衍射极限。

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  • Through analysis of the field scale samples in Wuqi oilfield by X-ray diffraction method, scaling causes and scale control measures are studied in downhole and gathering system.

    采用X -射线衍射方法分析了吴旗油田现场垢样成分,进而研究了吴旗油田井下及集输系统结垢原因和防垢措施。

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  • The inverse calculation for the phase of optical wave field of Fresnel diffraction is a significant but difficult work.

    衍射光场的相位逆运算是有意义并且困难的工作。

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  • Brsed on the wave theory of optics, the affect caused by the phase error in Fresnel near-field diffraction equation is analysed.

    根据波动光学的理论,对菲涅耳近场衍射公式误差相位的影响进行了分析。

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  • In this paper, the plane and anti-plane problems of the diffraction of elastic waves by a cavity filled with another medium are discussed. The method calculation, of the wave field is given in detail.

    本文讨论了填充介质腔为弹性波绕射的平面及反平面问题,详细地给出了波场的计算方法。

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  • Degree of preferred orientation of hard Sr ferrite compacts molded with magnetic field was studied by X ray diffraction analysis.

    利用X射线衍射分析方法,对湿压磁场成型的永磁铁氧体生坯晶体取向度进行了研究。

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  • In this paper, the flat field polychromator (SPD - I) using an aberration - corrected flat fie1d holographic concave diffraction grating as both spectroscopic and oPtical imaging element is re-POrted.

    报道一种利用象差校正平场全息凹面衍射光栅作为分光和成象元件的平场多色仪,该多色仪具有谱面平直、使用波段宽、集光本领强、体积小等优点。

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  • The crystal structure, morphology and luminescent properties of samples were analyzed by the X-ray diffraction, field emission scanning electron microscope and spectrofluorometer, respectively.

    通过X射线粉末衍射仪、场发射扫描电子显微镜和荧光分光光度计分别表征样品的晶体结构、颗粒形貌和发光性能。

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  • A complete design example of elliptical window optical system is demonstrated and the results show that the MTF of optical system approaches the diffraction limit across the entire scanning field.

    给出了完整的椭球形窗口光学系统的设计,设计结果表明,系统的调制传递函数在整个扫描视场范围内接近衍射极限。

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  • The X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectrometer (EDX) were used to characterize the products.

    用X射线粉末衍射仪(XRD)、场发射扫描电镜(FE - sem)和X射线能谱仪(EDX)对产物进行了表征。

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  • The X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectrometer (EDX) were used to characterize the products.

    用X射线粉末衍射仪(XRD)、场发射扫描电镜(FE - sem)和X射线能谱仪(EDX)对产物进行了表征。

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