Base on this expression, the spectra in the diffraction field were investigated theoretically.
根据该表达式对衍射场中的光谱进行了理论研究。
By solving these equations, the diffraction trace of a curved surface and the position of the edge's diffraction point are determined so that the diffraction field can be obtained.
求解寻迹方程，便得到曲面绕射线的轨迹和边缘绕射点的位置，从而可以计算它的绕射场。
The crystal structure, morphology and luminescent properties of samples were analyzed by the X-ray diffraction, field emission scanning electron microscope and spectrofluorometer, respectively.
通过X射线粉末衍射仪、场发射扫描电子显微镜和荧光分光光度计分别表征样品的晶体结构、颗粒形貌和发光性能。
The crystal structure, morphology and luminescent properties of samples were analyzed by the X-ray diffraction, field emission scanning electron microscope and spectrofluorometer, respectively.
通过X射线粉末衍射仪、场发射扫描电子显微镜和荧光分光光度计分别表征样品的晶体结构、颗粒形貌和发光性能。
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