Processing time is further decreased by creating multiple scan chains and applying them to multiple pins of the device under test (DUT).
通过产生多个扫描链并将其施加于被测器件(DUT)的多个管脚,可以进一步减少处理时间。
The Anritsu MS4661A can provide a wealth of knowledge about a device under test (DUT), including its magnitude, phase, group-delay response.
该安立ms4661 a可以提供丰富的知识,对设备进行测试(dut),包括其幅度,相位和群延迟响应。
Examples of the invention can relate to an apparatus for testing a device under test (DUT).
本发明的例子涉及用于测试待测器件(DUT)的装置。
The Anritsu MS4661A can provide a wealth of knowledge about a device under test (DUT), including its magnitude, phase, and group-delay response.
该安立ms4661 a可以提供丰富的知识,对设备进行测试(dut),包括其幅度,相位和群延迟响应。
The Anritsu MS4661A can provide a wealth of knowledge about a device under test (DUT), including its magnitude, phase, and group-delay response.
该安立ms4661 a可以提供丰富的知识,对设备进行测试(dut),包括其幅度,相位和群延迟响应。
应用推荐