Processing time is further decreased by creating multiple scan chains and applying them to multiple pins of the device under test (DUT).
通过产生多个扫描链并将其施加于被测器件(DUT)的多个管脚，可以进一步减少处理时间。
The Anritsu MS4661A can provide a wealth of knowledge about a device under test (DUT), including its magnitude, phase, group-delay response.
该安立ms4661 a可以提供丰富的知识，对设备进行测试(dut)，包括其幅度，相位和群延迟响应。
Examples of the invention can relate to an apparatus for testing a device under test (DUT).
本发明的例子涉及用于测试待测器件(DUT)的装置。
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