Processing time is further decreased by creating multiple scan chains and applying them to multiple pins of the device under test (DUT).
通过产生多个扫描链并将其施加于被测器件(DUT)的多个管脚，可以进一步减少处理时间。
Examples of the invention can relate to an apparatus for testing a device under test (DUT).
本发明的例子涉及用于测试待测器件(DUT)的装置。
应用推荐