• The hopping conduction in energy gap of amorphous semiconductors at low temperature is explained by calculating hopping probability when an electron hops from one defect center to the other.

    通过计算电子缺陷中心另一种缺陷中心的跳跃几率解释了半导体中的低温跳跃导电问题。

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  • Some important parameters such as defect concentration induced by electron irradiation are calculated.

    文中还计算了电子辐照在硅中所产生缺陷浓度一些重要参数

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  • The defect properties in chemical vapor deposition diamond films doped by sulfur and boron were investigated by the Doppler broadening measurements and electron paramagnetic resonance (EPR).

    利用多普勒增宽电子磁共振研究和掺金刚石薄膜缺陷状态。

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  • This paper discusses defect of interpretation of metal conduction's classical electron theory, and analysis factors of contradiction.

    探讨经典电子论对金属导电解释缺欠,具体分析引起矛盾因素

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  • A method combining the relativistic multichannel theory with the multichannel quantum defect theory is presented to calculate electron impact excitation.

    介绍了用相对论多通道理论结合量子亏损理论计算电子碰撞激发过程方法

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  • Under light and electron microscope, it was seen that HCY 2 gene resulted in structure disturbance, endocardial cushion defect and hypoplasia of heart.

    HCY2基因引起心脏结构紊乱、心内膜缺损抑制心室心房发育,并可损害心肌细胞超微结构。

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  • The surface microstructures of spherical Pt single crystals are studied by reflection electron microscopy, and the defect configurations in the crystals are also analysed.

    本文反射电子显微术观察球状单晶表面微观结构,分析了单晶形成内部缺陷的变化。

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  • The multistable defect in electron-irradiated Fz silicon has been studied by usingDLTS.

    利用深能级瞬态谱(DLTS)对电子辐照区熔多稳态缺陷进行研究的结果表明。

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  • Objective To explore the clinical application of electron beam CT (EBCT) in the diagnosis of ventricular septal defect (VSD ) classification of double outlet right ventricle.

    目的探讨电子束CTEBCT右室出口室间隔缺损VSD分型诊断中的临床价值。

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  • The surface defect on medium and heavy plate Q235B was investigated by means of the optical microscopy, scanning electron microscopy and energy spectrum analysis in this paper.

    Q 235 B中厚表面缺陷处显微组织、非金属夹杂物等进行了金相组织扫描电镜观察及能谱分析

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  • The surface defect on medium and heavy plate Q235B was investigated by means of the optical microscopy, scanning electron microscopy and energy spectrum analysis in this paper.

    Q 235 B中厚表面缺陷处显微组织、非金属夹杂物等进行了金相组织扫描电镜观察及能谱分析

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