Morphology of functional polysiloxane film and their orientation on fiber have been observed and studied by an atomic force probe microscope (AFM) and other instruments.
用原子力探针扫描电镜AFM等仪器对聚硅氧烷的膜形态及其排列方式作研究。
The film and its surface morphologies of amino-polysiloxane were observed and studied by means of atomic force probe microscopy(AFM) and contact angle measurement instrument.
应用原子力显微镜（AFM）和接触角测量仪对乙酸酐改性氨基聚硅氧烷的成膜性及膜形态进行了研究。
On the basis of the aiming principle of the atomic force probe a-long with 2D micro-displacement system and the high precision capacitive sensors , the micro-dimension measurement system is developed.
本文基于原子力微探针瞄准原理并结合二维微位移系统和高精度电容传感器，研制了微尺寸测量系统。
Atomic force microscopy generates very high-resolution images (about 5-nanometer resolution) by “feeling” the surface of a sample with a tiny probe tip.
原子力显微镜是运用一种微小的探针去“感受”样本表面，能得到高分辨率的影像（约5纳米的分辨率）。
An experiment was conducted to study the high-temperature annealing characteristics of polysilicon films using atomic force microscope, secondary ion mass spectroscopy and probe.
利用原子力显微镜、二次离子质谱分析仪和探针，对多晶硅薄膜的高温退火特性进行了实验研究。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
The distance between the terminal atom and the probe of conduction atomic force microscopy is quite flexible, and the electronic transport properties of molecules are sensitive to the distance.
分子末端原子与探针的距离具有较大地自由度，不同的接触距离导致了分子的电流值有较大地差别。
The distance between the terminal atom and the probe of conduction atomic force microscopy is quite flexible, and the electronic transport properties of molecules are sensitive to the distance.
分子末端原子与探针的距离具有较大地自由度，不同的接触距离导致了分子的电流值有较大地差别。
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