The researchers analysed the sizes and structures of ash particles using a variety of techniques, such as atomic force microscopy, scanning electron microscopy and X-ray diffraction.
研究人员使用不同的技术研究了火山灰颗粒的尺寸和结构，例如原子力显微镜、电子扫描显微镜和X射线衍射。
In addition, the microstructure of the MgO thin films were examined with X-ray diffraction (XRD), Atomic Force Morphology (AFM) and Transmission Electron Micrograph (TEM).
同时，用X射线衍射(XRD)、原子力显微电镜(afm)和透射电镜(TEM)对薄膜的微观结构进行了分析。
The structural and magnetic properties of the granular film are studied by atomic force microscope, energy dispersion X-ray spectrum, X-ray diffraction, and alternating gradient magnetometer.
利用原子力显微镜、能量散射X射线谱、X射线衍射和交变梯度磁强计研究了该颗粒膜材料的结构和磁学性质。
The surface morphology and characteristics of the films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and atomic force microscopy (AFM).
该薄膜的表面形态和特征采用扫描电子显微技术(SEM)，X射线衍射(XRD)以及原子力显微技术(afm)描述。
X ray scattering and diffraction are sensitive to thin film materials that thickness is the several atomic layer to many tens micrometers.
X射线散射和衍射对于厚度为几个原子层到几十微米的薄膜材料是灵敏的。
Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM), scanning electron microscopy(SEM), X-ray powder diffraction(XRD), and BET method.
用原子力显微镜（AFM），扫描电子显微镜（SEM），X 射线粉末衍射仪（XRD），BET 比表面积分析仪对其结构进行了表征。
X-ray diffraction (XRD), atomic forced microscopy (AFM) and electronic diffraction spectroscopy (EDS) were respectively used to measure the morphologies, phase structures and composition.
通过X射线衍射（XRD）、原子力显微镜（AFM）、电子衍射能谱（EDS）等手段对薄膜进行了相的形成、结构特性及薄膜组成等的测试。
The crystal structure is characterized by X-ray diffraction (XRD) and the morphological characterizations are observed by atomic force microscopy (AFM).
用X射线衍射来表征晶体的结构，用原子力显微镜来表征表面形貌。
The crystal was characterized by four-crystal X-ray diffraction, chemical etching, optical microscope, transmission spectra and atomic force microscope (AFM).
通过四晶X射线衍射、化学腐蚀、光学显微、透过光谱以及原子力显微镜对晶体的质量进行了表征。
The crystal was characterized by four-crystal X-ray diffraction, chemical etching, optical microscope, transmission spectra and atomic force microscope (AFM).
通过四晶X射线衍射、化学腐蚀、光学显微、透过光谱以及原子力显微镜对晶体的质量进行了表征。
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