• In case of deviation of the measured average thickness from the specified average value, the Wafer Yield adjustment has to come into force.

    万一出现,测量平均厚度技术要求平均厚度出现偏差晶片成品率必须进行调整

    youdao

  • According to different region's climatic feature and yield level, a suggestion about crops' distribution adjustment is put forward, providing a scientific basis for the construction of local optima...

    根据不同区域气候特点产量水平提出作物布局调整方案,本地优势作物基地建设提供了科学依据

    youdao

  • According to different region's climatic feature and yield level, a suggestion about crops' distribution adjustment is put forward, providing a scientific basis for the construction of local optima...

    根据不同区域气候特点产量水平提出作物布局调整方案,本地优势作物基地建设提供了科学依据

    youdao

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