In case of deviation of the measured average thickness from the specified average value, the Wafer Yield adjustment has to come into force.
万一出现，测量的平均厚度与技术要求的平均厚度出现偏差，晶片的成品率必须进行调整。
According to different region's climatic feature and yield level, a suggestion about crops' distribution adjustment is put forward, providing a scientific basis for the construction of local optima...
并根据不同区域气候特点和产量水平，提出了作物布局调整方案，对本地优势作物基地建设提供了科学依据。
应用推荐