给出了确定透明均匀薄膜光学常数和厚度的方法。
A method for determining both the optical constants and the thickness of thin films from transmission spectrum has been presented.
结合激光外差干涉法和透射式椭偏测量原理，研究了一种快速、高精度测量纳米厚度薄膜光学参数的方法。
Based on the optical heterodyne interferometer and transmission ellipsometry, a new fast measurement technique of nanometer film was presented computational.
结合激光外差干涉术和反射式椭偏测量技术，设计了一种抗干扰能力强，快速、高精度测量纳米厚度薄膜光学参数的方法。
Optical heterodyne interferometry together with reflective ellipsometry, a fast measurement technology with high anti-interference performance was applied to nanometer film.
在此基础上根据薄膜光学计算理论和最优化理论，提出了一种测量多层薄膜厚度的新的全局优化算法——GASA算法。
According to the theories of thin film calculation and optimization, a new global optimization method - GASA for multilayer film thickness calculation is presented in this paper.
在此基础上根据薄膜光学计算理论和最优化理论，提出了一种测量多层薄膜厚度的新的全局优化算法——GASA算法。
According to the theories of thin film calculation and optimization, a new global optimization method - GASA for multilayer film thickness calculation is presented in this paper.
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