• 工艺性能模拟分析表明,此结构具有SOI器件电流低输出电容特性,而且抑制加热效应效应。

    The novel LDMOSFET did not degrade the advantage of SOI structure's low leakage current and parasitic capacitance, which also suppressed the self-heating effects and floating body effects.

    youdao

  • 工艺性能模拟分析表明,此结构具有SOI器件电流低输出电容特性,而且抑制加热效应效应。

    The novel LDMOSFET did not degrade the advantage of SOI structure's low leakage current and parasitic capacitance, which also suppressed the self-heating effects and floating body effects.

    youdao

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