本文主要论述集成电路加速寿命测试理论方法和IC常见失效模式。
The paper mainly dwells on the common failure modes and the IC accelerating life span test theory and technology.
介绍了半导体激光二极管（LD）寿命测试中存在的问题，并据此给出了LD高温加速寿命测试的积分球扫描法。
The problems of laser diode life test are introduced, and the integrating cavity scanning (ICS) method is given in laser diodes (LD) high-temperature accelerating life test.
介绍了半导体激光二极管（LD）寿命测试中存在的问题，并据此给出了LD高温加速寿命测试的积分球扫描法。
The problems of laser diode life test are introduced, and the integrating cavity scanning (ICS) method is given in laser diodes (LD) high-temperature accelerating life test.
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