界面层的存在使介电系数、自发极化、矫顽电压、漏电流都与薄膜的厚度有关。
Dielectric constant polarization coercive voltage and leakage current have relations with the thickness of thin films because of the interface layer.
得到了阈值电压和比例差分峰值，界面陷阱密度和应力时间的关系。
The relationship between the threshold voltage and the peak of proportional difference, and between the interface trap density and stress time are also acquired.
计算并讨论了所加电压与界面势垒对器件的复合电流及其复合效率的影响。
The influences of applied bias and interface barriers on carriers recombination and its efficiency are calculated and discussed.
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