原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
代表输出中时间连续增量的各接触点，可以被看成是反转和未反转信号的扫描。
The contacts representing successive increment of time in the outputs can be looked upon as the sweeping of the reversed and unreversed signals.
它可以快速地扫描所有的接触您的设备上，而且他们的组类型的信息丢失。
It can quickly scan all the contacts on your device, and group them by the type of information missing.
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