...m豆丁网 预定将来能连接扫描穿隧显微仪（Scanning Tunneling Microscope, STM）与原子力显微仪（Atomic Force Microscope, AFM）等表面分析仪，使整套实验站 空间解析度可涵盖 0.1 奈米至次微米之范围，以便观测 各不同阶段的表面...
基于1个网页-相关网页
使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。
The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).
本文采用原子力显微镜和X射线粉末衍射仪研究了PVA溶液旋转涂膜的溶剂化效应。
The solvent effect on the preparation of PVA film by low speed spin machine was studied by using AFM and XRD.
用原子力显微镜（AFM），扫描电子显微镜（SEM），X 射线粉末衍射仪（XRD），BET 比表面积分析仪对其结构进行了表征。
The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM), scanning electron microscopy(SEM), X-ray powder diffraction(XRD), and BET method.
应用推荐