It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope (SPM), the eye and hand of nanometer science and technology.
提高作为纳米科技的“眼”和“手”的扫描探针显微镜(SPM)的测量和定位精度，是纳米仪器界始终追求的目标。
The influence of external vibration on scanned images of scanning probe microscope (SPM) is discussed.
探讨了外界激振对扫描探针显微镜(SPM)扫描图像的影响。
Up to now the imported commercial scanning probe microscope (SPM) has not an automatic error correcting and reducing system.
目前，我国引进的一般商业性的SPM(扫描探针显微镜)中缺少误差的自动修正和改进系统。
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