It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope (SPM), the eye and hand of nanometer science and technology.
提高作为纳米科技的“眼”和“手”的扫描探针显微镜(SPM)的测量和定位精度，是纳米仪器界始终追求的目标。
The influence of external vibration on scanned images of scanning probe microscope (SPM) is discussed.
探讨了外界激振对扫描探针显微镜(SPM)扫描图像的影响。
Up to now the imported commercial scanning probe microscope (SPM) has not an automatic error correcting and reducing system.
目前，我国引进的一般商业性的SPM(扫描探针显微镜)中缺少误差的自动修正和改进系统。
Scanning probe microscope (SPM) is used not only for measuring the micro profiles of surfaces, but also for nano ultraprecise machining and atom manipulation now.
扫描探针显微镜(SPM)现在不仅用于表面微观形貌的检测，同时也用于纳米超精密加工和原子操纵。
A typical nanostructured titania super hydrophilic film was chosen for general characterization employing a Scanning Probe Microscope (SPM) and an electrochemical measurement system.
选用典型的二氧化钛纳米超亲水薄膜，用扫描探针显微镜(SPM)和电化学测试系统进行一般性的表征。
A general trend of Scanning Probe Microscope (SPM) is to multiple functionality and digitalization.
扫描探针显微镜(SPM)当前的发展趋势是功能复合化和数字化。
Tube scanner′s structure errors have great effect on the measurement accuracy of Scanning Probe Microscope(SPM).
单管式扫描器的结构误差是影响扫描探针显微镜测量精度的主要误差因素之一。
Nanofabrication in electrical field by Scanning Probe Microscope (SPM) can fabricate electrical devices and mechanical structures in nanometer scale.
利用扫描探针显微镜(SPM)能够实现纳米级电子器件和机械器件的加工。
A calibration method for the non-linearity of the Scanning Probe Microscope (SPM) "s PZT scanner was described."
针对扫描探针显微镜的压电扫描器提出一种非线性校正方法。
A calibration method for the non-linearity of the Scanning Probe Microscope (SPM) "s PZT scanner was described."
针对扫描探针显微镜的压电扫描器提出一种非线性校正方法。
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