In this thesis, Scanning Force Microscopy (SFM) was used to study the nanoscale electric phenomena of the surface and interface properties of ferroelectric thin films.
本论文利用扫描力显微镜研究了铁电薄膜表面与界面的电势及电畴等微区性质。
Thus the ions are continuously accelerated to implant the sample surface by the change electric field of the sheath, so as to achieve to modify the surface properties.
在鞘层中电场的作用下，离子被源源不断地加速注入到样品表面，从而达到改善材料表面性能的目的。
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