...tics方法的技术优势：1)无需定标；2)能测更宽的粒径范围；3)无需依赖Double Layer模式4)无需依赖( electric surface properties)电表面特牲；5)零表面电荷条件下也可测量粒径；6)可适用于无水体系；7)可适用于高导电(highly conducting)体系； 优于微电泳方法...
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In this thesis, Scanning Force Microscopy (SFM) was used to study the nanoscale electric phenomena of the surface and interface properties of ferroelectric thin films.
本论文利用扫描力显微镜研究了铁电薄膜表面与界面的电势及电畴等微区性质。
Thus the ions are continuously accelerated to implant the sample surface by the change electric field of the sheath, so as to achieve to modify the surface properties.
在鞘层中电场的作用下，离子被源源不断地加速注入到样品表面，从而达到改善材料表面性能的目的。
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