本论文依据四探针法的基本原理并结合双脉冲技术，设计并制造适用于薄膜温差电材料的电阻率测试系统。
The thin film TE material resistivity measurement system which is designed in the thesis bases on the principle of four-probe method and double pulse technology.
采用双材料基本解建立边界元法基本方程，计算双材料界面裂纹尖端附近的应力和位移场。
The stress intensity factors of bimaterial interface crack are analyzed using the boundary element method with bimaterial fundamental solutions.
应用推荐