本论文依据四探针法的基本原理并结合双脉冲技术，设计并制造适用于薄膜温差电材料的电阻率测试系统。
The thin film TE material resistivity measurement system which is designed in the thesis bases on the principle of four-probe method and double pulse technology.
采用双材料基本解建立边界元法基本方程，计算双材料界面裂纹尖端附近的应力和位移场。
The stress intensity factors of bimaterial interface crack are analyzed using the boundary element method with bimaterial fundamental solutions.
采用双材料基本解建立边界元法基本方程，计算双材料界面裂纹尖端附近的应力和位移场。
The stress intensity factors of bimaterial interface crack are analyzed using the boundary element method with bimaterial fundamental solutions.
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