延迟线是集成电路测试系统的关键部件。
故障模拟是数字电路测试的重要组成部分。
本方案已经通过硬件、软件调试以及电路测试。
It has passed the hardware and software debug and circuit test.
介绍了一种角跟踪电路测试系统的设计和实现。
This paper presents the design and realization of a measurement system of the angle-tracing circuit.
在电路测试时利用这个程序来计算故障覆盖率。
The author uses the C program to finish the parallel fault simulation that is used to calculate the fault coverage.
集成电路测试是微电子领域中一个日益重要的问题。
The testing of integrated circuits is an emerging issue in Microelectronics.
介绍了ASL3000集成电路测试系统的检定方法。
This paper introduces the verification method of ASL3000 IC test system.
本文还针对异步时序电路测试生成问题进行了有益的研究。
In this dissertation, some beneficial researches on test pattern generation for asynchronous circuits are taken.
应用电感传感器和D/A功放电路测试了电机静动态特性。
The static and dynamic characteristics are tested recurring to inductance sensor and power magnifying of D/A output.
该方法在铁路轨道电路测试系统的应用中取得了很好的效果。
The proposed method has been used in circuit teat system for railway tracks.
本文提出了产生数字电路测试码的一种算法——主路径敏化法。
This paper presents an algorithm of test patterns generation for digital circuits which is called the principal path sensitization method.
并行测试技术是解决当今大规模电路测试难题的一个重要手段。
The parallel test generation technology is an important method to resolve the difficult problem of test on massive circuits.
如何实现同步时序电路的初始化是时序电路测试中的关键问题。
How to implement the initialization for synchronous sequential circuits is a important issue.
但是，电气测试仪将面临高密度pcb和甚高频电路测试的挑战。
Electrical testers are widely used, but they are facing challenges from high-density PCB assemblers and very high frequency boards' testing tasks.
实验证明，该方法简单有效，是一种可行的模拟及混合电路测试方法。
The experimental results show that it is simple and efficient, thus allowing a feasible-scheme for analog and mixed-signal circuits.
集成电路测试系统的校准关系到集成电路测试结果的准确性和可靠性。
Calibration of IC test system is critical to the precision and reliability of IC test results.
模拟电路测试的过程主要分为两个部分：一是故障诊断，二是故障定位。
Analog circuit testing is mainly divided into two parts: one is the fault diagnosis, the other is fault location.
数字集成电路测试内容包括逻辑功能测试、直流参数测试和交流参数测试。
Digital IC test content includes logic functional test, test of DC parameters and test of AC parameters.
阐述了单片微波集成电路测试系统的工作原理、测试方法和自动测试程序。
The paper presents the operating principle of MMIC test system measurement method and test programmer.
对不可测故障进行测试产生是影响时序电路测试产生效率的一个重要因素。
Testing generation of un test faults is a major factor influencing the efficiency of sequential circuits testing generation.
本文提出了一种新的基于VHDL语言的组合数字电路测试码自动生成方法。
The paper proposes a mew method for testing combinational digital circuit which is based on the VHDL language.
同时，说明了虚拟仪器技术在厚膜混合集成电路测试中的设计步骤和应用流程。
At the same time, the designated procedures and application flowchart of Virtual Instrument technology in HIC circuits measurement is studied.
讨论了逻辑电路测试生成系统(简称TGS)中使用的一种模型数据及预处理方法。
A kind of model data and the preprocessing method for the logic circuit test generation system (TGS) are presented.
直流参数测试是集成电路测试的一种重要方法，是保证集成电路性能、质量的关键手段之一。
DC parameters test is an important method of IC test. It is one of the key means to ensure the performances and qualities of IC.
边界扫描技术是一种标准的数字电路测试及可测试性设计方法，它在工业界得到了广泛的应用。
As a standard technique of test and Design-For-Testability for testing the digital printed circuit board, Boundary-Scan technique has obtained widespread application in electronic equipment.
新型多用途电路测试笔，结构简单、安装调试容易，体积小巧，携带方便，功能强、用途广泛。
A new multi-circuit test pens has simple structure, easy installation, small size and easy to carry, strong function and versatile.
基于无复位时序电路，详细研究了有复位状态的同步电路测试生成问题及在无复位电路中的应用。
In order to test the circuits that has not any reset state, special way for resolving start state is described.
集成电路测试是保证产品质量的重要手段，如何检测MCU类复杂大规模集成电路是测试的难点。
IC test is the most important method to ensure the product quality. It is a difficult problem to test the complicated VLSI such as MCU.
硬件工程师从抽象的更高层次开始工作，并使用模拟器和其他自动化的形式在电路测试板上进行原料填充。
Hardware engineers started working at higher levels of abstraction and using simulators and other forms of automation to do all the stuff they used to do on breadboards.
硬件工程师从抽象的更高层次开始工作，并使用模拟器和其他自动化的形式在电路测试板上进行原料填充。
Hardware engineers started working at higher levels of abstraction and using simulators and other forms of automation to do all the stuff they used to do on breadboards.
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