延迟线是集成电路测试系统的关键部件。
故障模拟是数字电路测试的重要组成部分。
本方案已经通过硬件、软件调试以及电路测试。
It has passed the hardware and software debug and circuit test.
阐述了单片微波集成电路测试系统的工作原理、测试方法和自动测试程序。
The paper presents the operating principle of MMIC test system measurement method and test programmer.
因此﹐在给敏感设备焊锡之前﹐必须将台式电源与测试电路断开。
So disconnect the bench top power supply from circuit under test before soldering sensitive device.
测试及维修电子电路组件和设备。
介绍了系统的测试原理及电路结构设计。
The testing theory and design of circuit structure are introduced.
此外，电路的消耗功率和可测试性也是我们设计上的考虑重点。
Moreover, power and testability issue of the design are also considered.
这两种测试电路正常工作。
第三部分是对偏置电路的设计与测试。
本文给出竞争冒险的测试电路、测试方法和测试结果。
Test circuit, test method and results of race hazard circuit are presented in this paper.
此外，还给出了具体电路的参数和试验测试结果。
In addition, parameter and test data of the specific circuit is presented.
自动检测技术操作简单，且测试速度快，但需要增加辅助检测电路。
The automatic test technology is fast and easy to operate, but needs some extra circuits.
测试系统硬件电路设计。
集成电路工艺的改进使存储器的测试面临着更大的挑战。
Test of memory faces enormous challenge because of the semiconductor technology progress.
该电路是为测试电路相同。
根据此方法已研制成功一个实用的单片机应用电路板测试系统。
According to this method, a practical test system has been made successfully.
该测试方法能侦测到被测电路基本组成单元的任意组合失效；
The test approach can detect any combinational faults within basic cell of CUT.
系统根据引信时序电路中被测对象的特点和测试需求，建立了专用测试系统的硬件平台。
A hardware platform of special test system was constructed by the characteristic and test requirement.
文章给出了电路的内部结构、软件流程和测试结果。
The internal structure of the circuit, software flow and experimental results are described.
通过对验证电路的测试，结果表明该设计可满足实际使用的要求。
Through the test circuit, the result shows that the design can be actually used.
锁相电路被用来制作荧光寿命测试系统，并给出了实验结果。
Phase-locked loop is chosen to measure the fluorescence lifetime. The experimental results …
锁相电路被用来制作荧光寿命测试系统，并给出了实验结果。
Phase-locked loop is chosen to measure the fluorescence lifetime. The experimental results …
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