延迟线是集成电路测试系统的关键部件。
阐述了单片微波集成电路测试系统的工作原理、测试方法和自动测试程序。
The paper presents the operating principle of MMIC test system measurement method and test programmer.
集成电路工艺的改进使存储器的测试面临着更大的挑战。
Test of memory faces enormous challenge because of the semiconductor technology progress.
集成电路工艺的改进使存储器的测试面临着更大的挑战。
Test of memory faces enormous challenge because of the semiconductor technology progress.
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