延迟线是集成电路测试系统的关键部件。
集成电路测试是微电子领域中一个日益重要的问题。
The testing of integrated circuits is an emerging issue in Microelectronics.
介绍了ASL3000集成电路测试系统的检定方法。
This paper introduces the verification method of ASL3000 IC test system.
本文介绍一种新型的单片微机控制的数字集成电路测试仪。
This paper introduces a new type digital integrated circuit tester controlled by single chip computer.
集成电路测试系统的校准关系到集成电路测试结果的准确性和可靠性。
Calibration of IC test system is critical to the precision and reliability of IC test results.
数字集成电路测试内容包括逻辑功能测试、直流参数测试和交流参数测试。
Digital IC test content includes logic functional test, test of DC parameters and test of AC parameters.
阐述了单片微波集成电路测试系统的工作原理、测试方法和自动测试程序。
The paper presents the operating principle of MMIC test system measurement method and test programmer.
同时，说明了虚拟仪器技术在厚膜混合集成电路测试中的设计步骤和应用流程。
At the same time, the designated procedures and application flowchart of Virtual Instrument technology in HIC circuits measurement is studied.
直流参数测试是集成电路测试的一种重要方法，是保证集成电路性能、质量的关键手段之一。
DC parameters test is an important method of IC test. It is one of the key means to ensure the performances and qualities of IC.
该文从集成电路测试的过程概述性地介绍了集成电路的测试技术和集成电路的自动测试系统。
A very brief summary of the process of IC test and the technology of IC test in this paper. Also the automate test system is introduced in the paper.
本发明涉及集成电路测试领域，公开了一种集成电路的低功耗测试图形生成器及其测试方法。
The invention relates to the test field of integrated circuits and discloses a low power consumption test pattern generator of an integrated circuit and a test method thereof.
集成电路测试是保证产品质量的重要手段，如何检测MCU类复杂大规模集成电路是测试的难点。
IC test is the most important method to ensure the product quality. It is a difficult problem to test the complicated VLSI such as MCU.
针对集成电路测试中模拟和混合电路的测试问题，提出了一种基于小波分析的电流测试实现混合信号电路故障诊断的方法。
How to test the analogue and mixed-signal circuits has become very critical to the IC testing, a novel fault diagnosis method based on current testing is proposed for mixed-signal circuits.
直流参数测试是集成电路测试技术的重要组成部分，能够快速有效的检测芯片的性能，受到集成电路测试行业的高度重视。
DC parametric testing is an important component of IC test, it has got more attention from IC test industry, because it could detect the performance of the IC quickly and efficiently.
本文基于SAPPHIRE集成电路测试系统，介绍了自行开发的从VCD测试向量到STIL测试向量的转换软件及流程。
This paper introduces the special software and flow converted from VCD test vector to STIL test vector, which is based of SAPPHIRE SOC test System.
集成电路测试系统的研发是集成电路测试产业的重要组成部分，研发和制造高水平的集成电路测试系统具有十分重要的意义。
The research of IC test system is a key part of IC test industry and the research and production of a sophisticated test system is of great importance.
另外，美国系统将支持集成电路设计和模拟测试，数字和射频应用。
Also, American Systems will support integrated circuit design and testing for analog, digital and radio frequency applications.
这种专用集成电路，目前正处于测试和评估阶段。
Space Micro received application-specific integrated circuit (ASIC) devices in March from their silicon foundry and are under test and evaluation.
针对TSAT专用集成电路(ASIC)的测试，充分展示了微芯片在航空飞行中的功能、速度和匹配性。
Tests of the TSAT Application Specific Integrated Circuit (ASIC) demonstrated the microchip \ 's functionality, speed and suitability for spaceflight.
在集成电路(404)的测试过程中，它在晶片测试模式下通信。
During the testing of the integrated circuit (404), it communicates in the wafer test mode.
方形光二极管阵列包括四个集成在通用磷化铟（InP）衬底上的光二极管单片集成电路，采用低制造、集成与测试率的铟镓砷化物/磷化铟半导体工艺制造。
The Quad PD Arrays consist of four photodiodes monolithically integrated on a common indium phosphide (InP) substrate, and are fabricated using a low FIT rate InGaAs/InP semiconductor process.
由于CMOS集成电路中的故障和制造缺陷是多种多样的，其中有些故障既不能被电压测试也不能被稳态电流测试方法检测出来。
Due to the diversity of the faults and manufacturing defects in CMOS IC, some of the faults can neither be defected by voltage test nor by IDDQ test.
集成电路规模的增加，使电路的可测试性成了设计阶段必须考虑的问题，这就需要预先确定电路中各部份的测试性能。
As the scale of IC is increasing, its testability must be taken into account in the course of circuit design and the testability measure of circuits should be determined.
本文主要是对大规模、超大规模集成电路寄存器传输级（RTL）的自动测试产生算法进行研究。
This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).
该扫描路径上的延迟减少对外部缓冲器的需求，进而在集成电路扫描测试时避免保持时间违反。
The delay in the scan path reduces the need for external buffers to avoid hold-time violations during scan testing of integrated circuits.
通过对张力测试的分析及传感器的原理分析，介绍一种应用于测试微电子集成电路丝线张力的小量程张力测试机构的设计。
This paper introduces a design of machine in small range tension test which is applied to a field of micro-electronics integrate circuit, by analyzing tasting method and sensor theory.
针对模拟集成电路参数型故障的测试难题，提出了定位模拟集成电路参数型故障的功率谱相关分析方法。
Aiming at the problem of testing parametric fault in analog integrated circuits, an approach based on power spectrum correlation analysis for diagnosing parametric faults is presented.
集成电路工艺的改进使存储器的测试面临着更大的挑战。
Test of memory faces enormous challenge because of the semiconductor technology progress.
此方案已在以Z- 80微型机为控者的集成电路自动测试系统中实现。
This scheme has realized in an automated IC testing system controlled by Z-80 microcomputer.
此方案已在以Z- 80微型机为控者的集成电路自动测试系统中实现。
This scheme has realized in an automated IC testing system controlled by Z-80 microcomputer.
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