Xray diffraction (XRD) was used for phase identifications and texture examinations, and the surface morphology was studied using scanning electron microscopy (SEM).

X射线衍射（XRD）用于相鉴定和纹理的考试，和表面形貌使用扫描电子显微镜（SEM）研究。

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Xray diffraction (XRD) was used for phase identifications and texture examinations, and the surface morphology was studied using scanning electron microscopy (SEM).

X射线衍射（XRD）用于相鉴定和纹理的考试，和表面形貌使用扫描电子显微镜（SEM）研究。

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