Xray diffraction (XRD) was used for phase identifications and texture examinations, and the surface morphology was studied using scanning electron microscopy (SEM).
X射线衍射(XRD)用于相鉴定和纹理的考试,和表面形貌使用扫描电子显微镜(SEM)研究。
Xray diffraction (XRD) was used for phase identifications and texture examinations, and the surface morphology was studied using scanning electron microscopy (SEM).
X射线衍射(XRD)用于相鉴定和纹理的考试,和表面形貌使用扫描电子显微镜(SEM)研究。
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