其次，讨论了原子透镜在原子显微镜、原子探针、原子刻印、光栅制作等领域中的应用前景。
Then some potential applications of atomic lens in the atomic microscopy, atomic microprobe, atom lithography as well as fabrication of grating are discussed.
购买的成本是非常，非常低的，而实际上，显微镜上的物镜，我们用来观看原子图像的非常强大的镜头，也都从CD播放机拆下来的。
So this is very, very low-cost to buy, and actually, the objective lens in the microscope, the very powerful lens we use to image the atoms, is also from a CD player.
然而，研究人员并非采用加热整个样本的方案，而是使用了原子力显微镜(afm)一个加热探针去转换出一条仅有12纳米宽的导电带。
However, instead of heating the entire sample, the researchers used a hot atomic force microscope (AFM) tip to convert very narrow ribbons, measuring just 12 nm across, into reduced graphene.
原子力显微镜拍摄的17个忆阻器构成电路的图像。
An image of a circuit with 17 memristors captured by an atomic force microscope.
原子力显微镜是运用一种微小的探针去“感受”样本表面，能得到高分辨率的影像（约5纳米的分辨率）。
Atomic force microscopy generates very high-resolution images (about 5-nanometer resolution) by “feeling” the surface of a sample with a tiny probe tip.
我们不能像使用显微镜时，利用激光闪光，使得原子发光。
Well, laser flash that makes the atom glow while we - that this light that we use to image with, in the microscope.
该技术由瑞士国家科学基金会和帕卡德基金会提供资金支持，它通过编程来控制原子力显微镜（AFM）工作。
The method, developed with support from the Swiss National Science Foundation and the Packard Foundation, works by changing the programming that controls an Atomic Force Microscope (AFM).
列维和他的同事们用原子力显微镜和两片绝缘体（镧氧化铝和锶钛氧化物），研制出了一枚纳米晶体管。
Using an atomic force microscope and two layers of insulators (lanthanum aluminum oxide and strontium titanium oxide), Levy and his colleagues created a nanoscale transistor.
Abdullah Atalar教授目前在比尔·肯特大学从事原子力显微镜和数字集成电路设计的研究。
Professor Abdullah Atalar now researches atomic force microscopy and digital integrated circuit design at Bilkent University.
量子隧穿还是扫描隧道电子显微镜的一大特色。这是第一种能够拍摄和操作原子的显微镜。
Quantum tunneling is also a key feature of the scanning tunneling microscope, the first machine to enable the imaging and manipulation of individual atoms.
研究人员使用不同的技术研究了火山灰颗粒的尺寸和结构，例如原子力显微镜、电子扫描显微镜和X射线衍射。
The researchers analysed the sizes and structures of ash particles using a variety of techniques, such as atomic force microscopy, scanning electron microscopy and X-ray diffraction.
分辨率最高的电子显微镜可以分辨分子甚至单独的原子。
The most powerful electron microscopes can resolve molecules and even individual atoms.
这种原子力显微镜能够扫描象100纳米一样小的颗粒的形状。
The atomic force microscope can detail the shapes of particles as small as about 100 nanometers.
但是，即使有几百个原子的分子也是太小了，用最好的光学显微镜也看不见它们。
But even the larger molecules with several hundred atoms are too small to be seen with the best optical microscope.
原子力显微镜扫描对醛基化玻片表面形貌进行分析。
Scanning aldehyde group glass slide by atomic force microscopy study the surface shape.
新南威尔士大学的量子计算机技术中心(CQCT)和威斯康辛大学麦迪逊校区利用特殊的显微镜操纵原子联合研制了这块晶体管。
The University of New South Wales' Centre for Quantum Computer Technology (CQCT) and the University of Wisconsin-Madison created the transistor by manipulating atoms using a special microscope.
随着原子力显微镜的诞生，使高分子单链的界面研究成为可能。
With the emersion of atomic force microscope, the study of single macromolecular chain at interfaces becomes possible.
日本研究者们使用了一种高速原子力显微镜(afm)拍摄一部小旋转酶给电池产生化学燃料的电影。
Japanese researchers have used a high-speed atomic force microscopy (AFM) to shoot a movie of the tiny rotating enzyme that produces the chemical fuel for cells.
原子力显微镜(afm)是目前最新的生物成像技术之一。
Atomic force microscope (AFM) is one of the newest imaging techniques in the field of biomedicine.
因为SRS显微镜通过侦测原子之间化学键的固有振动来完成工作，因此无须侵入性荧光标记。
Because SRS microscopy works by detecting the intrinsic vibrations in chemical bonds between atoms, it doesn't require intrusive fluorescent labeling.
拍摄这个尘埃的设备称为原子力显微镜，通过用弹簧末端上的一个细尖扫描尘埃来绘制这个颗粒的三维形状。
The device that imaged the dust speck is called an atomic force microscope, which maps the shape of particles in three dimensions by scanning them with a sharp tip at the end of a spring.
原子力显微镜(afm)是研究DNA有力工具，在对DNA研究中有其独特优势。
Atomic force microscope (AFM) is a powerful tool in DNA research, in has its unique superiority in DNA research.
光杠杆法是原子力显微镜(afm)悬臂定位的主要方法。
Optical lever method is a main technique to detect the cantilever's position in atomic force microscope (AFM).
用原子力显微镜作为测量工具，获取表面形貌数据。
And the surface texture data by atomic force microscope (AFM) are obtained.
原子力显微镜(afm)是近十几年来表面成像技术中最重要的进展之一。
AFM is the foremost development on the image technique of the surface in near ten years.
文中对原子力显微镜(afm)电场诱导硅氧化结构的部分形状特征进行了分析和讨论。
This paper analyzes and discusses some structure's features on the surface of silicon by atomic force microscope (AFM) electrical field induced oxidation.
原子力显微镜(afm)是进行纳米测量和操作的一种主要工具。
Atomic Force Microscopy (AFM) is a main instrument for nano-scale measurement and manipulation.
原子力显微镜(afm)是进行纳米测量和操作的一种主要工具。
Atomic Force Microscopy (AFM) is a main instrument for nano-scale measurement and manipulation.
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