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这组方程可用来处理异质结构中的高场输运问题。
This equation group can be used to solve high field transport problems in heterostructures.
进一步的研究表明从中平面高场侧注入靶丸对芯部加料有显著改善。
The significant improvement of core fueling with pellet injection from high field side (HFS) in the mid-plane has been presented.
重点研究了退化PMOS器件的高场退火效应和氧化层陷阱电子的退陷阱机制。
Also, High electric field annealing of stressed PMOSFET and detrapping of trapped electrons on the gate oxide are studied deeply.
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