讨论了逻辑电路测试生成系统(简称TGS)中使用的一种模型数据及预处理方法。
A kind of model data and the preprocessing method for the logic circuit test generation system (TGS) are presented.
本文给出一个时序逻辑电路的多故障测试模拟程序。
This paper presents a multiple fault test simulator for sequential logic circuit. The simulator is implemented in serial-parallel to save memory.
组合逻辑电路的最大动态电流测试应在电路的原始输入端施加一个特定的测试序列才能实现。
A special testing sequence input is need for measuring maximum dyna - mic current of a combinational logic circuit.
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