本发明涉及的是一种表面自身纳米化后横截面透射电镜样品的制备方法。
The invention relates to a preparation method for a cross-section transmission electron microscope sample after the self surface thereof is processed by nanocrystallization.
本文介绍了透射式电子显微镜（TEM）用的横截面样品的制作技术。
The technique for preparing cross-sectional specimen of semiconductor for TEM is shown.
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