电子器件投稿系统 关键词： 可靠性分析，退化失效，竞争失效，金属化膜脉冲电容器 [gap=648]Keywords: reliability, degradation failure, competing failure, metallized-film pulse capacitor
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本文讨论了材料退化失效的基本概念，给出了微观结构随机演化的动力学方程，统一导出了失效几率，可靠性、失效几率密度、失效率和平均寿命。
Some key concepts in degradated failure of materials is discussed. The stochastic evolution equation of defect clusters is given and the failure probability reliability and failure rate are derived.
通过分析金属化膜脉冲电容器的退化失效机理，利用该竞争失效模型，对金属化膜脉冲电容器进行了可靠性分析，确定了该型电容器的可靠度函数。
Then, by analyzing degradation mechanism of metallized-film capacitor, this paper presents a life distribution model of metallized-film pulse capacitor using the models.
通过对这些失效因素的研究并通过一定的再设计手段，可以减少热载流子效应导致的器件退化。
The device degradation induced by HCE can be reduced by studying these failure factors to resign the circuits.
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