过载效应是裂尖钝化、裂尖附近残余压应力和裂尖尾部塑性诱导闭合等共同作用的结果。
The overload effects were controlled by various factors such as crack blunting, residual compressive stress ahead of the crack tip and crack closure induced by wake zone plasticity.
但是大多数高强度气体灯在寿命后期均表现出整流效应，这将导致镇流器及其相关部件过载。
However, Rectifying effect will appear in most HID lamps at the end of their lives. This will lead to overload in the ballast and relative components.
读数偏置可能由输入放大器过载或输入端的直流整流效应所引起。
A reading offset may be caused by input amplifier overload or DC rectification at the input.
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