由谱峰强度公式导出了吸附层的厚度和离子束对其剥离速率的表达式。

We derived formulas of thickness of absorbed layer and etching rate of an ion beam from the formula of intensity peaks.

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本文运用计算机模拟技术对红外谱图进行吸收峰的剥离和模拟，用VB语言编制了吸收峰的剥离程序，并用实验谱图对所编程序进行了检测。

The exfoliation and simulation of IR spectra peaks were studied with the help of computer simulation technology. A practical program used for exfoliation of spectra was compiled in VB language.

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