为了减少测试向量的存储需求，提出一种基于扭环计数器作为测试向量产生器的横向和竖向测试数据压缩的BIST方案。
In order to reduce the storage requirements for the test patterns, a vertical and horizontal test data compression BIST scheme based on the test pattern generation of twisted-ring counter is proposed.
文章介绍的是采用由高速脉冲计数器、PL C和光电增量编码器构成的位置环控制系统。
The article expound a kind of position control system that is made up of high speed pulses counter, PLC and light cell code device.
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