被绝缘的金属基体技术 insulated metal substrate technology
通常，第一层为氧化硅，绝缘体，其被蚀刻至所需的厚度。
Usually, the first layer is of silicon oxide, an insulator, which is etched to a desired thickness.
由于不要求被测样本为非绝缘体，原子力显微镜将可能成为边缘粗糙度测量精度要求不断提高的最有效工具。
AFM may be the most effective instrument to satisfy the demand of ITRS to improve the measurement precision constantly since its observed objects are not limited in nonconductor only.
绝缘体和导体向来都站在对立面，绝缘体中的电子被紧紧束缚在原子上，因此没有电流能够通过。
After all, insulators are the very opposite of conductors: their electrons are tightly bound to atoms and the material resists the flow of electrical current.
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