利用传播衰减法测量梁结构阻尼应考虑边界反射等影响。
Thus, the boundary reflection effect and other effects must be considered during using the propagation-attenuation method to measure damping of a beam.
本文介绍高频光电导衰减法硅单晶少子寿命测试技术的改进。
Improvement of high frequency photoconductive decay technique for measuring silicon minority carrier lifetime is described.
结合试验过程中遇到的问题，给出了改进的直流衰减法测试电路。
Combined with the problems during the experiment, design a improved testing circuit of Direct Current Attenuation Method.
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