衰减全反射（Attenuated Total Reflection，ATR）：光波入射时，入射面内偏振的单色平面光波在密－疏媒质的界上全反射时，光疏媒质中所形成的迅衰场(见衰减波)量可以被耦合到金属或半导体的表面上而使表面等离激元(SP)或表面极化激元共振激发。全反射的光强因而发生剧邃衰减的现象。 利用光学中的迅衰场与SP相耦合衰减全反射方法在1968年由A.奥托提出。
The effect of microwave plasma treatment on the chemical component and the physical structure of the interface in iPP/carbon black(CB) composites was investigated by X-ray photoelectron spectrum(XPS),attenuated total reflection FT-IR(ATR-FT-IR),thin film X-ray diffraction(TR-XRD)and polarization microscope(POM).
采用X射线光电子能谱(XPS)、衰减全反射红外光谱(ATR-FT-IR)、薄膜X射线衍射(TF-XRD)和偏光显微镜(POM)研究了微波等离子处理对聚丙烯/炭黑界面iPP化学组成和物理结构的影响。
参考来源 - 微波等离子体对聚丙烯/炭黑界面化学组成和物理结构的影响The methods of Attenuate Total Reflection (ATR) and Transmission were appliedto analytical study in MIR.
中红外区域的分析研究采用了衰减全反射和透射两种方法。
参考来源 - 红外光谱法中药成分检测研究·2,447,543篇论文数据，部分数据来源于NoteExpress
衰减全反射红外光谱技术是表层结构分析的有利手段。
Attenuated total reflection infrared spectroscopy (ATR) is a useful tool for surface analysis providing structural and chemical information about the sample.
提到意味着该待检物质紧密地接触用于衰减全反射（ATR）分析的内反射元件。
The reference 197A signifies that the substance under examination is intimately in contact with an internal reflection element for attenuated total reflectance (ATR) analysis.
衰减全反射(包含多次反射)涉及到被透射介质从内部反射的光，格外是多次反射时。
Attenuated total reflection (including multiple reflection) involves light being reflected internally by a transmitting medium, typically for a number of reflections.
应用推荐