射线衍射（XRD）测试表明ITO薄膜的晶粒尺寸随膜内氧的摩尔分数增加而增大，随氧气比例增加薄膜（400）晶向消失。
XRD test showed that grain size of ITO films increased and crystallization direction(400) disappeared with more oxygen flow.
X射线衍射分析结果表明，发酵使得玉米淀粉晶型结构消失。
The results of XRD analysis showed that the crystal type of corn starch was disappeared after the fermentation.
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