本文给出了辐射计的衍射损失，黑度修正及反射率修正，实际测量结果比计算结果大0.19%。
The diffraction loss, blackness correction and reflectance correction of the radiometer are given in this paper. The measurement result is 0 19% larger than the calculated result.
应用X射线衍射仪、高分辨电子显微镜和电子能量损失谱分析了纳米线的微观结构。
The nanowires were analyzed by X-ray diffraction, high resolution electron microscopy (HREM), electron energy loss spectroscopy.
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