通过测量多光束衍射强度，确定了斯托克斯参量。
The Stokes parameters were determined by measuring the multiple beam diffraction intensity.
提出了X射线衍射强度的权重因子定量相分析的新方法。
A new method is applied in this article to the quantitative phase analysis for weight factors of X-ray diffraction intensity.
通过测定高强度绝缘子的热膨胀和X射线衍射强度进行试验。
Tests were carried out by measuring the thermal expansion and the X-ray diffraction intensities of high-tension insulators.
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