但60和70年代，许多科研实验室早期的硫化镉薄膜技术试验结果都未尽人意。

But cadmium sulphide, an early thin-film technology that was pursued in the 1960s and 1970s in many research laboratories, did not live up to expectations.

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介绍了一种用于MEMS薄膜材料力学特性测试的单轴拉伸试验方法。

A uniaxial tensile test method for measuring mechanical properties of MEMS thin film materials is presented.

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对软基底薄膜热敏电阻器的可靠试验进行了研究，由试验数据找出失效原因，并提出改进措施。

Reliability test of flexible substrate thin-film thermistor is researched. The reasons of failure from the testing date are found and improved advices are pointed out.

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