该系统除了可以测试薄膜的位相特性外，还可以用于确定压电薄膜的压电系数，薄膜物理厚度反演等领域。
Versatile applications beyond phase measurement of the apparatus are demonstrated, including piezoelectric coefficient determination and physical thickness retrieval.
采用基于等离子体物理模型的时域有限差分方法模拟了金属薄膜近场成像特性；采用薄膜传输矩阵方法计算了金属薄膜对倏逝波分量的放大作用。
The property of the near field subwavelength imaging in a metal thin-film structure is investigated using finite difference time domain method based on Drude model.
由物理化学家米尔恰cotlet率领的团队使用相对简单的方法创造出了一个透明的薄膜。
A team led by physical chemist Mircea Cotlet created a transparent thin film using a relatively simple process.
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