本申请涉及用于半导体集成电路设备的缺陷分析方法和缺陷分析系统。
The invention relates to a defect analysis method for semiconductor integrated circuit devices and a defect analysis system.
本论文以有限元分析软件为开发平台，运用设计参数化和功能模块化技术，初步开发了面向铸造工程应用的铸件缩孔缩松预测及缺陷分析系统。
The main task of this paper is to develop prediction & analysis system of shrinkage cavity and porosity defect in a casting for foundry engineering application.
他们负责构建和维护代码分析器、开发环境、测试用例管理系统、自动化测试工具、构建系统、源代码控制系统、代码回顾计划、缺陷数据库。
We build and maintain code analyzers, IDEs, test case management systems, automated testing tools, build systems, source control systems, code review schedulers, bug databases...
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