该解调方法具有结构简单、扫描频率高、分辨率好、线性度好等优点。
This method has some advantages such as simple structure, high scan frequency, high resolution and good linearity.
介绍了Z -扫描技术的基本原理，以及Z -扫描技术在测量非线性光学介质的非线性折射率、非线性吸收系数等方面的应用。
The mechanism of Z - scan technique is introduced. It 's application to measuring nonlinear refractive index and nonlinear absorption coefficient for nonlinear optical medium is made.
在此基础上，建议了一种通过两次不同电压扫描率的线性电压扫描来测定半导体的体产生寿命和表面产生速度的方法。
On the basis of this, a method of using twice sweep under different voltage sweep rates for determining both bulk generation lifetime and surface generation velocity is proposed.
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