光栅图像格式将图片存储为描述像素状态的位图，而不是记录图元（譬如，线和曲线）的长度和位置。
Raster image formats store the picture as a bitmap describing the state of pixels, as opposed to recording the length and locations of primitives such as lines and curves.
本文主要研究利用低线数计量光栅实现具有大量程、纳米级分辨率的位移测量理论及其关键技术。
In this dissertation. The theory and key technologies to measure long-range displacement with nanometer resolution by metrology grating is studied.
对压弯光栅的线密度进行了实验研究。
Primary researches on the groove density variations of bending grating were experimented.
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